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TAIJIN / EDDY CURRENT TESTING

X1 Portable Eddy Current Flaw Detector

Portable eddy current testing equipment for metal surface defect inspection.

PRODUCT OVERVIEW

Portable Eddy Current Flaw Detector

Portable eddy current testing equipment for metal surface defect inspection.

Model: X1

Equipment type: Portable / Handheld

Product photos are sourced from the matching model listing. Available functions, optional probes, and the exact supplied configuration should be confirmed before ordering.

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Please specify model X1 in the inquiry requirements.

MODEL INFORMATION

X1 — stated specifications

The values below are taken from one listing with this exact model number. Listings for the same model may describe different configurations; confirm details with TAIJIN.

Model
X1
Display
Digital
Weight
6kg
Channels
Single Channel
Frequency Range
64 Hz ~ 5 MHz
Gain Range
0-90db,Minimum Step Size 0.5db
Phase Rotation
0~359°, Step 1°
Power Supply
AC 220V/110V
Specification
280 * 190 * 70mm (L * W * H)

Detailed technical parameters

Transcribed from the matching manufacturer's Made-in-China product description. Series-level values, options and configurations require confirmation before ordering.

Frequency
Two Independently Selectable Frequencies
Frequency Range
64 Hz ~ 5 MHz
Gain
0~90dB, Minimum Step 0.5dB
Phase Rotation
0~359°, Step 1°
Amplitude/Phase Measurement
Auto/Manual
Probe Type
Compatible with Absolute, Differential, Weld Probes, etc.
Electronic Balance
Fast Digital/Analog Electronic Balance
Signal Display
Impedance Plane Display, Real-time Memory of Multi-track Eddy Current Signals
Display Mode
With Memory Track Delay Blanking Function
Test Report
Test results can be directly generated into a test report and printed

ORIGINAL PRODUCT DETAIL IMAGES

X1 product details and inspection illustrations

Technical illustrations from the supplier's matching product description. The final scope of supply and optional functions should be confirmed with TAIJIN.

Discuss your inspection application

Tell us the tube or component material, diameter or dimensions, defect type, inspection speed and probe requirements. We will confirm a suitable system configuration.

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X1 enlarged photograph