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LS225 F500 Magnetic Induction Coating Thickness Gauge

LS225 with F500 probe for measuring suitable non-magnetic coatings over ferrous substrates.

PRODUCT OVERVIEW

LS225+F500 Coating Thickness Gauge

LS225 with F500 probe for measuring suitable non-magnetic coatings over ferrous substrates.

Model
LS225+F500
Product category
Coating Thickness Measurement
Source product listings
6

Optional accessories: Optional probe fixture stand, sold as a configuration accessory. The fixture is an optional accessory, not a separate instrument.

Measurement range, probe selection, calibration, accuracy and included accessories depend on the selected instrument configuration. Confirm specifications in the quotation.

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SOURCE TECHNICAL DATA

LS225+F500 Technical Parameters

Values are from matching seller documentation or instrument manufacturer references. Specifications, probe ranges, and application compatibility must be confirmed before ordering.

Display
240×160 dot matrix LCD
Power supply
4pcs of 1.5V AAA alkaline battery
Operation temperaturerange
0ºC-50ºC
Storage temperaturerange
-20ºC-60ºC
Host size
148*76*26 mm (L*W*H)
Weight (include battery)
194g
Measuring principle
Magnetic Induction
Measuring range
0.0-500μm
Resolution
0.1μm: 0μm - 99.9μm 1μm: 100μm - 500μm
Repeatability
≤ ± (0.8%H+0.1μm)Test with fixture, H is the standard value
Accuracy
≤±(2%H+0.3μm) after calibration of 1-5 points, H is the standard value
Unit
μm / mil
Measuring interval
1.5s
Minimum measuring area
Ø = 7mm
Minimum curvature
Convex:1.5mm / Concave:10mm
Minimum substrate thickness
0.1mm
Calibration
Support zero reference adjustment and 1 to 5-points calibration
Probe size
110*15 mm (Without connecting cable)
Probe weight
81g

ORIGINAL TECHNICAL IMAGES

LS225+F500 Product Details

Model-related technical photos and illustrations from the original seller listing, in source order. Company introductions, certificates and logistics/payment banners are excluded.

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Please include your substrate, coating material, estimated thickness range, accuracy needs and available probe space.

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